Reflecting our commitment to "Innovating Today, Inspiring Tomorrow," we are thrilled to announce a significant milestone in research and innovation at St. Thomas College of Engineering & Technology, Chengannur.
Esteemed faculty members from the Department of Computer Science and Engineering (CSE) have successfully published another Indian Patent, further establishing our institution's footprints in advanced technological development.
About the Innovation
The published patent is titled: "AI-enabled image-based quality inspection system with adaptive optical capture and real-time defect classification"
This cutting-edge research addresses critical challenges in industrial automation and quality control. By leveraging artificial intelligence and adaptive optics, the system delivers highly accurate, real-time defect classification, significantly optimizing manufacturing and inspection pipelines.
Meet the Inventors
This remarkable achievement is the result of the dedication, expertise, and collaborative effort of our distinguished faculty members:
- Prof. Rejeenth V R – Associate Professor, CSE
- Prof. Mahesh S – Assistant Professor, CSE
- Prof. Arathy Vijayan – Assistant Professor, CSE
- Prof. Geethu Mohan – Assistant Professor, CSE
Official Publication Details
| Specification | Details |
|---|---|
| Patent Title | AI-enabled image-based quality inspection system with adaptive optical capture and real-time defect classification |
| Publication Number | IN202641064966 A1 |
| Publication Date | 05-06-2026 |
| Journal Number | 23/2026 |
| Published In | Official Journal of the Patent Office, Government of India |
"Hearty congratulations to our esteemed faculty inventors for their remarkable innovation and invaluable contribution to research and development. Your success inspires our entire academic community to push the boundaries of technology!"
Date
05 June 2026
Venue
AI-enabled image-based quality inspection system with adaptive optical capture and real-time defect classification
Chief Guest